List of publications (January 2013)
0. M.Sc. Thesis
Hatzopoulos
A. A., "Microprocessor-based Far Infrared Spectrophotometer", MSc
Thesis, Dept. of Physics, Postgraduate program in Electronics, University of
Thessaloniki, 1983 (in Greek).
1. Ph.D. Dissertation
Hatzopoulos
A.A., "Fault Diagnosis in Analog Electronic Circuits: Study, Development
and Computer Implementation", Ph.D. Dissertation, Dept. of Electrical
Engineering, University of Thessaloniki, 1989 (in Greek).
2.
Publications in international journals with review process
[2.1]
Hatzopoulos
A.A., Halatsis C., "Microprocessor-based Far Infrared Spectrophotometer", Review of Scientific Instruments, pp
1498-1502, Sept. 1984.
[2.2]
Hatzopoulos
A. A., Theophilidis G., "A Simple Electronic unit Allowing Extracellular
Recording and Stimulation through the
Same Wire Hook
or Suction Electrode", Journal of Neuroscience Methods, pp 169-172,
v. 11, 1984.
[2.3]
Hatzopoulos
A.A., Kontoleon J.M., "Computer Simulation of Testing Procedures for Fault
Diagnosis in Analog Circuits", AMSE Modeling, Simulation and Control, vol.
8, No.2, pp 37-48, Autumn 1986.
[2.4]
Hatzopoulos
A.A., Kontoleon J.M., "Efficient Fault Diagnosis in Analogue Circuits
using a Branch Decomposition Approach", IEE Proc., Pt.G: Electronic
Circuits and Systems, vol. 134, No.4, pp 149-157, August 1987.
[2.5]
Hatzopoulos
A.A., Kontoleon J.M., "A New Approach for the Automatic Fault Diagnosis in
Analog Circuits", Int. J. of Circuit Theory and Applications, vol. 18, pp
387-400, 1989.
[2.6]
Hatzopoulos
A.A., Kontoleon J.M., "Fault Diagnosis in large Analogue Circuits
based on Hybrid Decomposition", IEE Proc., Pt. G:
Electronic Circuits and Systems,
vol.139, No. 3, pp 311-318, June, 1992.
[2.7]
Çatzopoulos
A.A., "Reducing the number of nonzero elements of topological loop (B) and cutset
(D) matrices", IEE
Electronics Letters, Vol. 28, No. 17, pp 1577-1579, 13th August 1992.
[2.8]
Papakostas
D.K., Hatzopoulos A.A., "Analogue Fault Identification based on power
supply current spectrum", IEE
Electronics Letters, Vol. 29, No. 1, pp 118-119, 7th January 1993.
[2.9]
Hatzopoulos
A.A., Siskos S., Kontoleon J.M., "A complete scheme of Built-in Self-test
(BIST) structure for fault diagnosis in analog circuits and systems", ÉĹĹĹ
Ôr. Instrumentation and Measurement, Vol. 42, No 3, June 1993.
[2.10]
Athanasiades
A., Hatzopoulos A.A., Theophilidis G., "A data-acquisition system for the
analysis of the isometric tension generated by an electrically stimulated
skeletal muscle", Computer Applications in the Biosciences, vol. 9, No 3,
June 1993.
[2.11]
Siskos
S., Hatzopoulos A.A., "Versatile CMOS comparator with adjustable window
and digital input reference", Int. J. of Electronics, vol. 74, no. 6, pp
933-938, 1993.
[2.12]
Papakostas
D.K., Hatzopoulos A.A., "Correlation-based comparison of analog signatures
for identification and fault diagnosis", IEEE Tr. Instrumentation and
Measurement, Vol. 42, No 4, pp 860-863, August 1993.
[2.13]
Papakostas
D.K., Hatzopoulos A.A., "Supply current testing in linear bipolar
ICs", IEE Electronics Letters, Vol. 30, No 2, pp 128-130, 1994.
[2.14]
Hatzopoulos
A.A., Siskos S., Laopoulos Th., “Current conveyor based test structures for
mixed-signal circuits”, IEE Proc., Pt. G: Circuits, Devices and Systems, vol.
144, No. 4, August, 1997.
[2.15]
Hatzopoulos
A.A., Siskos S., “A simple built-in current sensor for analog and mixed-signal
testing”, IEEE Tr. Instrumentation and Measurement, Vol. 46, No 6, Dec. 1997
[2.16]
Hatzopoulos
A.A., Iatrou E., Katsaras Chr., Papakostas D.K., "Testing of analog and
mixed-signal circuits by using supply current measurements", IEE Proc.,
Pt. G: Circuits, Devices and Systems, vol. 145, no 5, 1998, pp 319-324.
[2.17]
Hatzopoulos
A.A., “Computer-aided circuit analysis and design projects for Electronic
Engineering students”, IEE Engineering Science and Education Journal, vol. 8, no 1, 1999, pp 23-32.
[2.18]
Papakostas
D.K., Hatzopoulos A.A., “Estimation of statistical variables for analog fault
detectability evaluation”, IEE Proc., Pt. G: Circuits, Devices and Systems,
vol. 146, no 6, Dec. 1999, pp 350-354.
[2.19]
Papakostas
D.K., Hatzopoulos A.A., “Estimation of circuit output measurements including
statistically depended parameters”, Int. J. of Circuit Theory and Applications,
vol. 31, 2003, pp. 219-228.
[2.20]
Papakostas
D.K., Hatzopoulos A.A., “Impact of parameter covariance on fault detectability
estimation of analog and mixed-mode circuits”, IEE Proc. Circuits, Devices and
Systems, Vol.: 150, Issue: 5, 6 Oct. 2003, pp: 434-8.
[2.21]
Papakostas
D.K., Hatzopoulos A.A., “Detection of time-delay related faults using Fourier
phase components of power supply current ”, IEE Electronics Letters, vol.
40(1), Jan. 2004, pp. 7-8.
[2.22]
Papakostas
D.K., Hatzopoulos A.A., "Analogue Fault Detectability Comparison Between
Power Supply Current and Output Voltage Magnitude and Phase Spectrum
Components", IEE Electronics Letters, Volume: 40(8) ,
[2.23]
A.T.
Hatzopoulos, D.H. Tassis, N.A. Hastas, C.A. Dimitriadis, S. Siskos, and A.A.
Hatzopoulos, “A simple and continuous on-state current model of polysilicon
thin-film transistors for circuit simulation”, Journal of Physics: Conference
Series 10 (2005) pp. 27-30.
[2.24]
A.
A. Hatzopoulos, S. Siskos, C. A. Dimitriadis, N. Papadopoulos, I. Pappas and
L. Nalpantidis, “A built-in current sensor using thin-film transistors”,
Journal of Physics: Conference Series 10 (2005) pp. 289-293.
[2.25]
I
Pappas, L Nalpantidis, V Kalenteridis, S Siskos, C.A. Dimitriadis and A.A.
Hatzopoulos, “A study of different types of current mirrors using polysilicon
TFTs”, Journal of Physics: Conference Series 10 (2005) pp. 373-376.
[2.26]
Papadopoulos,
N. P., Hatzopoulos A.A., Papakostas D.K., CH. A. Dimitriadis, S. Siskos, "Modeling
the impact of light on the performance of polycrystalline thin-film transistors
at the sub-threshold region", Microelectronics Journal, Elsevier, Vol. 37,
Issue 11, November 2006, Pages 1313-1320.
[2.27]
N.
Arpatzanis, C. A. Dimitriadis, S. Siskos, A. A. Hatzopoulos, G. Kamarinos,
“Determination of bulk and interface density of states in polycrystalline
silicon thin film transistors”, Thin Solid Films, Elsevier, 515, pp. 7581-7584,
2007.
[2.28]
A.
A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, “Resolving Differences of
Parameter Extraction Methods for Integrated Inductor Design and Model
Validation”, Analog Integrated Circuits and Signal Processing , Springer, 53 (2-3), pp. 71-79, 2007.
[2.29]
Papakostas
D.K., Hatzopoulos A.A., “A unified
procedure for fault detection of analog and mixed-mode circuits using magnitude
and phase components of the power supply current spectrum”, IEEE Tr. on
Instrumentation and Measurement 57 (11), pp. 2589-2595, 2008.
[2.30]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “A Comparative Evaluation of
De-Embedding Methods for on-Wafer RF CMOS Inductor S-parameter Measurements”, Physica
Status Solidi (C) 5, No. 12, WILEY-VCH, pp. 3671–3676, 2008.
[2.31]
N.
P. Papadopoulos, A. A. Hatzopoulos, D.K.Papakostas, “An Improved Optical
Feedback Pixel Driver Circuit”, IEEE Tr. on Electron Devices, Feb. 2009, pp.
229-235.
[2.32]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “De-Embedding Method for On-Wafer RF
CMOS Inductor Measurements”, Microelectronics Journal, Elsevier, Volume: 40
Issue: 6 Pages: 958-965, JUN 2009.
[2.33]
Papadopoulos,
N. P., Hatzopoulos A. A., Papakostas D.K., Picos R., Dimitriadis Ch. A., Siskos
S., "A Light-impact model for n-type and p-type poly-Si TFTs", IEEE Journal
of Display Technology, Volume: 5 Issue: 7
Pages: 265-272, JUL 2009.
[2.34]
M.
Dimopoulos, A. Spyronasios, D. Papakostas, A. A. Hatzopoulos, “Wavelet-based
Mixed-Signal Testing Using Supply Current Measurements”, IET Science,
Measurement & Technology, Volume: 4 Issue: 2 Pages:
76-85, MAR 2010.
[2.35]
N.
P. Papadopoulos, D. K. Papakostas, A. A. Hatzopoulos, "Current-based
Testing of Optical Feedback Pixel Driver", IEEE Journal of Display
Technology, Volume: 6 Issue: 4 Pages: 150-157. APR 2010
[2.36]
Papakostas
D. K., Hatzopoulos A. A., “Improved analogue fault coverage estimation using
probabilistic analysis”, Int. J. of Circuit Theory and Applications, Volume: 38
Issue: 5 Pages: 503-514, JUN 2010.
[2.37]
Bontzios
YI, Hatzopoulos AA, “A Unified Method for Calculating Capacitive and
Resistive Coupling Exploiting Geometry Constraints on Lightly and Heavily Doped
CMOS Processes”,
IEEE TRANSACTIONS ON ELECTRON DEVICES Volume: 57 Issue:
8 Pages: 1751-1760, AUG 2010.
[2.38]
M.
Dimopoulos, D. Papakostas, A. Spyronasios, D. Konstantinou, A. A. Hatzopoulos,
“Circuit Implementation of a Supply Current Spectrum Test Method”, IEEE Tr. on
Instrumentation & Measurement, Volume: 59 Issue: 10
Pages: 2660-2670, OCT 2010.
[2.39]
Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, “An evolutionary method for efficient
computation of mutual capacitance for VLSI circuits based on the method of
images”, Simulation Modelling Practice and Theory, Vol. 19, Iss. 2, pp 638-648,
Feb. 2011.
[2.40]
A.
Spyronasios, M. Dimopoulos, A. A. Hatzopoulos, “Wavelet analysis for the
detection of parametric and catastrophic faults in mixed-signal circuits”, IEEE
Tr. on Instrumentation & Measurement, Volume: 60 Issue: 6
Pages: 2025-2038, June 2011.
[2.41]
Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, “A Non-Destructive Method for
Accurately Extracting the Substrate Parameters of Arbitrary Doping Profile in
Nanoscale VLSI”, IEEE Tr. on Instrumentation & Measurement, Vol. 60, no. 9,
pp. 3173-3184, Sept. 2011.
[2.42]
Papadopoulos, N.P., Hatzopoulos, A.A., Marsal, A., Puigdollers, J., Picos, R., “Current and
voltage simulation of an organic inverter”, International
Journal of High Speed Electronics and Systems 20 (4) , 2011, pp.
843-851.
[2.43]
Tsatsoulis, N.A., Bontzios, Y.I., Dimopoulos, M.G., Hatzopoulos, A.A., “Closed-form
expressions for the coupling capacitance of metal fill tiles in VLSI circuits”,
Microelectronics Journal, article in press, 2012.
[2.44]
Papadopoulos, N.P., Marsal, A., Picos, R., Puigdollers, J., Hatzopoulos, A.A. “Simulation of
organic inverter”, Solid-State
Electronics, vol. 68 , 2012, pp. 18-21
[2.45]
Drakaki, M., Siskos, S., Hatzopoulos, A., “A 0.5-20 GHz
bandwidth enhanced distributed amplifier”,
Microelectronic
Engineering, vol. 90 , 2012, pp. 26-28
[2.46]
Angeliki
Koupa, Michael Zervas, Yusuf Leblebici, A.A. Hatzopoulos, “Electrical Modelling
and Characterization of Through Silicon Vias”, submitted 2012.
[2.47]
Papagiannopoulos, I., Chatziathanasiou, V., Hatzopoulos, A. A., Kałuza, M., Wiecek, B.,De Mey, G., “Thermal analysis of integrated spiral inductors”,
Infrared Physics and Technology, Volume 56, January 2013,
Pages 80-84.
3.
Publications in proceedings of conferences
with review process
[3.1] Hatzopoulos A.A., Kontoleon J.M., "An Improved Algorithm for Non-linear Fault Diagnosis", Proc. of Int. AMSE Conf. on
Modeling and Simulation, vol. 2.2, pp 27-36, June 1984.
[3.2] Hatzopoulos
A.A., "Computer-aided fault diagnosis of electronic systems", Proc.
3rd Greek Conference on Informatics, pp. 576-589, Athens, May 1991.
[3.3] Papakostas
D.K., Hatzopoulos A.A., "Fault diagnosis of integrated circuits",
Proc. 6th Greek Conference of Physics, Thrace, Greece, 18-21 March, 1993.
[3.4] Papakostas
D.K., Hatzopoulos A.A., "Fault detection in linear bipolar ICs: comparative
results between power supply current and output voltage measurements",
Proc. IEEE Int. Symp. on Circuits & Systems, ISCAS '94, pp 5.61-5.64, May
1994.
[3.5] Papakostas D.K., Ioannou A. A., Hatzopoulos
A.A., "Fault identification in analog circuits using current spectrum
measurements", Proc. 8th Int. Symp. on Theoretical Electrical
Eng., ISTET '95, pp 40-43, Sep. 1995.
[3.6] Papakostas D.K., Ioannou A. A., Hatzopoulos
A.A., " Current spectrum measurements for analog fault diagnosis",
Digest of papers in Workshop on Iddq testing, IDDQ’95, Washington D.C., Oct.
1995.
[3.7] Wang
C.P., Hatzopoulos A.A., Wey C-L., “A test paradigm for analog and mixed-signal
circuits and systems”, Proc. IEEE Int. Symposium on Circuits & Systems,
ISCAS'96, vol.3, pp. 194-197, Atlanta, GA, May, 1996.
[3.8] Hatzopoulos
A.A., Siskos S., “A versatile mixed-signal test structure using current
conveyors”, Proc. IEEE Int. Mixed-signal Testing Workshop, IMSTW’96, pp.
193-197, Quebec, CA, May, 1996.
[3.9] Papakostas
D.K., Ęosmidis V., Hatzopoulos A.A., “Analog fault detectability based on
statistical circuit analysis”, Proc. IEEE Int. Conf. on Electronics, Circuits
& Systems, ICECS '96, vol.2, pp. 1076-1079, Rhodes, Greece, Oct. 1996.
[3.10] Siskos S., Laopoulos Th., Hatzopoulos A.A.,
Bafleur M.“A current conveyor based BIC sensor for current monitoring in
mixed-signal circuits”, Proc. IEEE Int. Conf. on Electronics, Circuits &
Systems, ICECS '96, vol.2, pp. 1210-1212, Rhodes, Greece, Oct. 1996.
[3.11] Hatzopoulos
A., G. Koukas, G. Mpinos, V. Petridis, A. Kehagias, “Analog implementation of
the Incremental Credit Assignment (ICRA) scheme for time series
classification”, Proc. Int. Conf. on Digital Signal Processing, DSP’97, Greece,
1997.
[3.12] Makrigiannis
E., Hatzopoulos A.A., “Microcontroller based on-line testing of analog and
mixed-signal systems”, Proc. Int. On-Line Testing workshop, IOLTW’97, Crete,
Greece, 1997.
[3.13] Hatzopoulos
A.A., “Computer-aided circuit analysis and design in an undergraduate
Electronics curriculum”, Proc. Int. Workshop on CAD in Electromagnetism and
Electrical Circuits, CADEMEC’97, Romania, 1997.
[3.14] Hatzopoulos
A.A., Siskos S., “Design of a simple built-in current sensor for analog and
mixed-signal testing”, Proc. ECCTD’97, Hungary, 1997.
[3.15] Papakostas
D.K., Palouktsoglou G.M., Hatzopoulos A.A., “Estimation of statistical
variables for analog circuit parameter evaluation”, Proc. IEEE Int. Conf. on
Electronics, Circuits & Systems, ICECS '97, Cairo, Egypt, Dec. 1997.
[3.16] Vlassis
S., Siskos S., Hatzopoulos A., Petridis V., Kehagias A., “Analog CMOS design of
the Incremental Credit Assignment (ICRA) scheme for time series
classification”, Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS'98,
Monterey, CA, 1998.
[3.17] A.
A. Hatzopoulos, An. Sifniadis, “Improved procedures for testing analog and
mixed-signal circuits using a microcontroller”, Proc. IEEE Int. Conf. on
Electronics, Circuits & Systems, ICECS '99, Paphos, Cyprus, 1999.
[3.18] A.
Hatzopoulos, “Power dissipation considerations in low-voltage CMOS circuits”,
Proc. Conf. Microelectronics, Microsystems and Nanotechnology, MMN’2000,
Athens, Greece, Nov. 2000.
[3.19] Á.
Hatzopoulos, P. Bougia, "A Design tool for planar Inductors using Cadence
software", Proc. 12th IEEE Mediterranean Electrotechnical Conference,
MELECON 2004, Dubrovnic, Croatia, 2004, pp 147-150.
[3.20] A.A.
Hatzopoulos, S. Siskos, C.A. Dimitriadis, N. Papadopoulos, I. Pappas and L.
Nalpantidis, "A Built-In Current Sensor using Thin-Film Transistors",
Conf. on Microelectronics, Microsystems and Nanotechnology MMN’2004, Athens, Greece, Nov. 2004
[3.21] I.
Pappas , L. Nalpantidis , V. Kalenteridis , S. Siskos , C. A. Dimitriadis and
A. A. Hatzopoulos, "A study of different types of current mirrors using
polysilicon TFTs", Conf. on Microelectronics, Microsystems and
Nanotechnology, MMN’2004, Athens, Greece, Nov. 2004
[3.22] A.T.
Hatzopoulos, D.H. Tassis, T.A. Hastas, C.A. Dimitriadis, S. Siskos, A.A.
Hatzopoulos, "A Simple and continuous on-state current model of Polysilicon
Thin-Film Transistor for Circuit Simulation", Conf. on Microelectronics,
Microsystems and Nanotechnology MMN’2004, Athens, Greece, Nov. 2004.
[3.23]
A.A. Hatzopoulos, S. Siskos, “Built-In Current Sensor
using Floating-Gate MOS Transistors for Low-Voltage Applications”, Proc. XIX
Conference on Design
of Circuits & Integrated Systems, DCIS '04, Bordeaux, Nov. 2004.
[3.24] A.A.
Hatzopoulos, S. Siskos, C.A. Dimitriadis, N. Papadopoulos, “Built-In Current
Sensor with reduced voltage drop using Thin-Film Transistors”, Proc. IEEE Int.
Symposium on Circuits & Systems, ISCAS'05, Kobe, Japan, May 2005.
[3.25]
A.A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs,
“Analysis of coil parameter extraction methods for on-chip inductor design”,
Proc. ECCTD 05, Cork, Ireland, Aug. 2005.
[3.26]
Papakostas
D.K., Hatzopoulos A.A., "Fault Detectability of Double Analogue
Measurements using Probabilistic Analysis", Proc. 5th Int. Conf. on
Technology and Automation, ICTA 05, Thessaloniki, October 15-16, 2005.
[3.27]
Papakostas
D.K., Hatzopoulos A.A., "A Fault Diagnosis Expert System Structure with
Knowledge Retrieving Capability from Waveforms", Proc. 5th Int. Conf. on
Technology and Automation, ICTA 05, Thessaloniki, October 15-16, 2005.
[3.28]
A.A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs,
“Impact of parameter extraction methods on integrated inductor design”, Proc. XX
Conference on Design
of Circuits & Integrated Systems, DCIS '05, Lisbon, Nov. 2005.
[3.29]
A.A. Hatzopoulos, S. Eleftherakis, "A tool for
optimal design of integrated Inductors using Cadence software", Proc. XX
Conference on Design
of Circuits & Integrated Systems, DCIS '05, Lisbon, Nov. 2005.
[3.30]
I.
Makrygiannis, A.A. Hatzopoulos, G. Gielen "A simplified model for
the substrate noise simulation", Proc. XX Conference on Design of Circuits &
Integrated Systems, DCIS '05,
Lisbon, Nov. 2005.
[3.31]
I. Pappas, V. Kalenteridis, L. Nalpantidis, S. Siskos,
Ch. Dimitriadis,
A.A. Hatzopoulos, “A new analogue driver using Poly-Si Thin-Film Transistors
for Active Matrix Displays”, Proc. XX Conference on Design of Circuits & Integrated
Systems, DCIS '05, Lisbon, Nov. 2005.
[3.32]
T.
Noulis, S. Siskos, G. Sarrabayrouse, L. Bary, A. A. Hatzopoulos, “Detailed
Study of BSIM3v3 Flicker Noise Models in NMOS and PMOS Transistors from
Threshold to Saturation”, Proc. XX Conference on Design of Circuits &
Integrated Systems, DCIS '05, Lisbon, Nov. 2005.
[3.33]
I.
Pappas, A. T. Hatzopoulos, D. H. Tassis, N. Arpatzanis, S. Siskos, A.A.
Hatzopoulos, C. A. Dimitriadis and G. Kamarinos, "A Simple Polysilicon
Thin-Film Transistor SPICE Model", Proc. 25th Int. Conf. on Microelectronics
(MIEL 2006), Belgrade, Serbia, May, 2006, pp. 513-516 .
[3.34]
N.
P.Papadopoulos, A.A. Hatzopoulos, D.K. Papakostas, C.A. Dimitriadis, S. Siskos
, "Estimating the influence of light on the performance of polycrystalline
thin-film transistors at the sub-threshold region", Proc. 13th IEEE
Mediterranean Electrotechnical Conference, MELECON 2006, Málaga, Spain,
May 2006.
[3.35]
A.
A. Hatzopoulos, S. Stefanou, G. Gielen, D. Schreurs, `Assessment of Parameter
Extraction Methods for Integrated Inductor Design and Model Validation` ,
Proc. IEEE Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May
2006.
[3.36]
I.
Pappas, L. Nalpantidis, V. Kalenteridis, S. Siskos, A.A. Hatzopoulos, Ch. Dimitriadis,
"A threshold voltage variation cancellation technique for analogue
peripheral circuits of a display array using poly-Si TFTs", Proc. IEEE
Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May 2006, pp. 3305-3308.
[3.37]
N.
P. Papadopoulos, A. A. Hatzopoulos, D. K. Papakostas, Ch. A. Dimitriadis, S.
Siskos, "Modeling the impact of light on the performance of
polycrystalline thin-film transistors at the sub-threshold region", Proc.
IEEE Int. Symposium on Circuits & Systems, ISCAS`06, Greece, May 2006, pp.
429-432.
[3.38]
N.
Arpatzanis, C.A. Dimitriadis, S. Siskos, A. A. Hatzopoulos, G. Kamarinos, “Determination
of bulk and interface density of states in polycrystalline silicon thin film
transistors”, 5th Symposium on Thin Films for Large Area Electronics held at
the EMRS 2006 Spring Meeting, Nice, FRANCE, JUN, 2006.
[3.39]
D.
K. Papakostas, A. A. Hatzopoulos, “Analog measurements Fault Detectability
using Probabilistic Analysis”, Proc. XXI Conference on Design of Circuits &
Integrated Systems, DCIS '06, Barcelona, Nov. 2006.
[3.40]
N.
P. Papadopoulos, A. A. Hatzopoulos, H. Pappas, D. K. Papakostas, S. Siskos, C.A.
Dimitriadis, “SPICE Model for the simulation of the Light impact on the
performance of polycrystalline Thin-Film Transistors”, Proc. XXI Conference on
Design of Circuits & Integrated Systems, DCIS '06, Barcelona, Nov. 2006.
[3.41]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “Improving the accuracy of the
De-embedding methods for on-wafer RF measurements”, Proc. XXI Conference on
Design of Circuits & Integrated Systems, DCIS '06, Barcelona, Nov. 2006.
[3.42]
A.
A. Hatzopoulos, A. Spyronasios, `A New Model for single and multiple
Interconnects in RF CMOS Integrated Circuits”, Proc. XXI Conference on Design
of Circuits & Integrated Systems, DCIS '06, Barcelona, Nov. 2006.
[3.43]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, "CMOS Inductor Performance
Estimation Using Z- and S-Parameters", Proc. IEEE Int. Symposium on
Circuits & Systems, ISCAS'07, New Orleans, USA, 2007, pp. 2256-2259.
[3.44]
N.P.Papadopoulos,
A.A. Hatzopoulos, D.K. Papakostas, “New Optical Feedback Pixel driver circuit
and its Simulation in SPICE”, 27th IDRC,
SID Conference Record of the International Display Research Conference,
pp. 437-440, EuroDisplay 2007, Moscow, Russia, September 2007.
[3.45]
D.
K. Papakostas, A. A. Hatzopoulos “Impact of circuit Parameter Derivative
Calculation on Estimation of Statistical variables for Analog Fault
Detectability Evaluation”, Proc. IMSTW’07, Portugal, 2007.
[3.46]
N.P.Papadopoulos,
A.A. Hatzopoulos, D.K. Papakostas, C.A. Dimitriadis and S. Siskos, “Verifying
the Spice Model for the Simulation of Light impact on the performance of
poly-TFT”, Proc. 4th International Workshop on Nanosciences and
Nanotechnologies, NN07, Thessaloniki, Greece, 2007
[3.47]
M.G.
Dimopoulos, D. K. Papakostas, A. A. Hatzopoulos, E. I. Konstantinidis, A. D. Spyronasios,
“Design and Development of a Versatile Testing System for Analog and
Mixed-Signal Circuits”, Proc. ECCTD 07, Sevilla, Spain, Aug. 2007, pp. 846-849.
[3.48]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “Improving the Quality Factor Estimation
for Differentially Driven RF CMOS Inductor “, Proc. ECCTD 07, Sevilla, Spain,
Aug. 2007, pp. 599-602.
[3.49]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, D. K. Papakostas, “Comparison of RF
Inductor Performance Evaluation Methods”, Proc. 6th Int. Conf. on Electronics,
Hardware, Wireless and Optical Communications EHAC '07, pp. 35-39, Corfu
Island, Greece, February, 2007.
[3.50]
M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “A Comparative Evaluation of
De-Embedding Methods for on-Wafer RF CMOS Inductor S-parameter Measurements”, Conf. on Microelectronics,
Microsystems and Nanotechnology, MMN’2007, Athens, Greece, Nov. 2007.
[3.51] M.G.
Dimopoulos, D. K. Papakostas, A. A. Hatzopoulos, E. I. Konstantinidis, A. D.
Spyronasios, “Microcontroller-based Production-Line Testing”, Proc. XXII
Conference on Design of Circuits & Integrated Systems, DCIS '07, Sevilla,
Spain, Nov. 2007, pp. 553-557.
[3.52] Yiorgos
Bontzios, A.A. Hatzopoulos, S. Stefanou, Konstantinos Nikelis, “A Scalable
Model for Calculating Resistive Losses on Lightly and Heavily Doped
Substrates”, Proc. XXII Conference on Design of Circuits & Integrated
Systems, DCIS '07, Sevilla, Spain, Nov. 2007.
[3.53] M.
Drakaki, A. A. Hatzopoulos, S. Siskos, “Improved Calculation of Differentially
Driven RF CMOS Inductor Model Parameters, ”, Proc. XXII Conference on Design of
Circuits & Integrated Systems, DCIS '07, Sevilla, Spain, Nov. 2007.
[3.54] A.A.
Hatzopoulos, D. Schreurs, G. Gielen, A. D. Spyronasios, “Integrated inductor
quality factor enhancement considerations”, Proc. XXII Conference on Design of
Circuits & Integrated Systems, DCIS '07, Sevilla, Spain, Nov. 2007.
[3.55] M.G.
Dimopoulos, D. K. Papakostas, D. K. Konstantinou, A. D. Spyronasios A. A.
Hatzopoulos, “Multiple Parametric Circuit Analysis Tool for Detectability Estimation”,
Proc. ICECS 07, Morrocco, Dec. 2007, pp. 1111-1114.
[3.56] D.
K. Konstantinou, M. G. Dimopoulos, D. K. Papakostas, A.A. Hatzopoulos, A. Spyronasios,
“Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach”, Proc.
11th IEEE Workshop on Design and Diagnostics of Electronic Circuits & Systems
(DDECS 2008), Slovakia, April 2008, pp. 251-254.
[3.57] D.
K. Konstantinou, M. G. Dimopoulos, D. K. Papakostas, A.Spyronasios, A. A.
Hatzopoulos, “Simulation and Measurements for Testing an Emergency Luminaire
Circuits”, Proc. 14th IEEE Mediterranean Electrotechnical Conference, MELECON
2008, Corsica, France, May 2008, pp. 646-650.
[3.58] N.P.Papadopoulos,
A.A. Hatzopoulos, D.K. Papakostas, Rodrigo Picos, C.A. Dimitriadis and S.
Siskos, "A New Light-impact Model for p-type and n-type poly-TFT",
Intern. Symposium on Flexible Organic Electronics (IS-FOE ’08), Chalkidiki,
Greece, July, 2008.
[3.59] M.
G. Dimopoulos, D. K. Papakostas, A.Spyronasios, A.A. Hatzopoulos, D. K.
Konstantinou, “Power Supply Current Testing in the Production Line of Emergency
Luminaire Circuits”, Proc. IEEE Int. Conf. on Electronics, Circuits &
Systems, ICECS '08, Malta, Aug. 2008, pp. 778-781.
[3.60] Yiorgos
Bontzios, A.A. Hatzopoulos, “A New Method for Calculating Resistive Losses on Lightly
and Heavily Doped Substrates”, Proc. 16th IFIP/IEEE Int. Conf. on
Very Large Scale Integration, VLSI-SOC’08, Rhodes, Greece, 2008.
[3.61] M.
G. Dimopoulos, A.Spyronasios, D. K. Papakostas, D. K. Konstantinou, A.A.
Hatzopoulos, “Wavelet-based Mixed-Signal Testing Using Supply Current
Measurements”, Proc. XXIII Conference on Design of Circuits & Integrated
Systems, DCIS '08, Grenoble, France, Nov. 2008.
[3.62] Chatziathanasiou
V., Hatzopoulos A.A., Papagiannopoulos
I. “Simulation and measurements of the thermal behavior of integrated
inductors”, Proc. 4th European Advanced Technology Workshop on Micro-packaging
and Thermal Management,
[3.63] N.P.Papadopoulos,
A.A. Hatzopoulos, D.K. Papakostas, "Testing of an Optical Feedback Pixel
Driver Using Supply Current" , Proc. 16th International Conference Mixed
Design of Integrated Circuits and Systems, MIXDES 2009, Łódź,
Poland, June 2009.
[3.64] M.
Dimopoulos, A. Spyronasios, D. Papakostas, D. Konstantinou, B. Vassios, A.A.
Hatzopoulos, “Analog and Mixed-Signal Testing by Wavelet Transformations of
Power Supply Current Measurements”, Proc. 16th International Conference Mixed
Design of Integrated Circuits and Systems, MIXDES 2009, Łódź,
Poland, June 2009.
[3.65] M.
E. Kiziroglou, A. Á. Hatzopoulos, M. K. Husain and C. H. de Groot, «Simulation
of spin-wise transmission at Schottky contacts», 6th International Workshop on
Nanosciences and Nanotechnologies, NN09, Thessaloniki, Greece, 2009.
[3.66] Chatziathanasiou
V., Hatzopoulos A.A., Papagiannopoulos
I., “Thermal behavior of integrated inductors: a case study”, 16th
Int. Conf. on Thermal Engineering and Thermogrametry, THERMO’09, Budapest,
July, 2009
[3.67] D.
Konstantinou, M. Dimopoulos, D. Papakostas, S. Stathis, G. Goudelis, A.A.
Hatzopoulos, “Pattern Recognition Methods Application for Analog Circuit Fault
Detection” - XXIV Conference on Design of Circuits and Integrated Systems (DCIS
2009), Zaragoza, Spain, 18-20 November 2009.
[3.68] Yiorgos
Bontzios, Alkis Hatzopoulos, “A Margarita Shaped Inductor Offering Wider
Frequency Range in Comparison with Spiral Inductors”, Presented in 39th
European Solid-State Device Research Conference, ESSDERC 2009, Athens, Sept.
2009.
[3.69] N.
Papadopoulos, A. Marsal, J. Puigdoller,
A.A. Hatzopoulos, “Fabrication of complementary Organic Inverters with
different W/L ratios”, Proc. ISFE 2010, Mallorca, Spain, Apr. 2010
[3.70] N.
Papadopoulos, A. Marsal, J. Puigdoller,
A.A. Hatzopoulos, “Fabrication and Simulation of complementary Organic
Inverter”, Proc. ISFE 2010, Mallorca, Spain, Apr. 2010
[3.71] Y.
Bontzios, A.A. Hatzopoulos, “A Universal Model for Calculating Capacitive and
Resistive Coupling on Lightly and Heavily Doped CMOS Processes”, Proc. 17th
International Conference Mixed Design of Integrated Circuits and Systems, MIXDES
2010, Wroclaw, Poland, June 2010.
[3.72] M.
G. Dimopoulos, A. D. Spyronasios, A.A.
Hatzopoulos, “Wavelet Energy-based Mahalanobis Distance Metric for Testing
Analog and Mixed-Signal Circuits”, Proc. 17th International Conference Mixed
Design of Integrated Circuits and Systems, MIXDES 2010, Wroclaw, Poland, June
2010.
[3.73] N.P.
Papadopoulos, R. Picos, A. Marshal, J. Puigdollers, R. Alcubilla, A.A.
Hatzopoulos, Fabrication of a Complementary Organic Inverter and its modeling
and Simulation in CADENCE”, Proc. Intern. Symposium on Flexible Organic
Electronics, IS-FOE 2010, Chalkidiki, Greece, July 2010
[3.74] M.
G. Dimopoulos, D. K. Papakostas, B. D. Vassios A.A. Hatzopoulos, “Wavelet
Analysis of Current Measurements for Mixed-Signal Circuit Testing”, Proc. IEEE
Int. Symposium on Circuits & Systems, ISCAS'10, Paris, France, May 2010.
[3.75] A. D. Spyronasios, M. G. Dimopoulos, N.P.
Papadopoulos, A.A. Hatzopoulos, “Testing
Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits using
Wavelets”, Proc. ISVLSI 2010, Kefalonia, Greece, July 2010
[3.76] M. G. Dimopoulos, A. D. Spyronasios, A.A. Hatzopoulos, “Wavelet
Analysis of Measurements for On-Line Testing Analog & Mixed-Signal
Circuits”, Proc. IOLTS 2010, Corfu, Greece, July 2010
[3.77] Yiorgos Bontzios, Alkis Hatzopoulos, “A
Comparison of Substrate Coupling Noise Between Heavily and Lightly Doped
Processes With a Grounded Backplane Contact”, XXV Conference on Design of
Circuits and Integrated Systems (DCIS 2010), Lanzarote, Spain, November 2010.
[3.78] A.
D. Spyronasios, M. G. Dimopoulos, D. Papakostas, A.A. Hatzopoulos “Support Vector Machine Methods
Application for Analog & Mixed-Signal Circuit Fault Detection” XXV
Conference on Design of Circuits and Integrated Systems (DCIS 2010), Lanzarote,
Spain, November 2010.
[3.79] M.
G. Dimopoulos, A. D. Spyronasios, N.P.
Papadopoulos, A.A. Hatzopoulos, “Efficient
Testing of an Optical Feedback Pixel Driver Using Wavelet Analysis”, Proc. IEEE
Int. Conf. on Electronics, Circuits & Systems, ICECS '10, Athens, Greece, Dec.
2010.
[3.80] Y.
Bontzios, M. G. Dimopoulos, A.A. Hatzopoulos, “Efficient Inductance Calculation
for Long and Medium Length Rectangular Interconnects in VLSI Circuits”, Proc.
IEEE Int. Symposium on Circuits & Systems, ISCAS'11, Rio De Janeiro,
Brazil, May 2011.
[3.81] Ő.
Bontzios, M. Dimopoulos, A. Hatzopoulos, "Exact Closed-form Expressions
For Substrate Resistance and Capacitance Extraction in Nanoscale VLSI,"
6th International conference on Design & Technology of Integrated Systems
in nanoscale era (DTIS 2011), Athens, 6-8 April 2011.
[3.82] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, "A Wideband Scalable and SPICE-Compatible
Model for On-Chip Interconnects Coupling Up to 60 GHz," 6th International
conference on Design & Technology of Integrated Systems in nanoscale era
(DTIS 2011), Athens, April 2011.
[3.83] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, “A memetic algorithm for computing 3D
capacitance in multiconductor VLSI circuits”, IEEE 14th International Symposium
on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011,
pp. 341 - 346
[3.84] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, “Automated Substrate Resistance
Extraction in Nanoscale VLSI by Exploiting a Geometry-based Analytical Model”,
IEEE 18th Int. Conf. on Mixed Design of Integrated Circuits and Systems,
(MIXDES 2011), Gliwice, Poland 16-18 June 2011
[3.85] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, "Closed-Form Expressions for the
Coupling Capacitance Between Through Silicon Vias and Interconnects for 3D
ICs," 18th Int. Conf. Mixed Design of Integrated Circuits and Systems,
(MIXDES 2011), Gliwice, Poland, 16-18 June 2011
[3.86] N.P.Papadopoulos,
A.A. Hatzopoulos, D.K. Papakostas, Rodrigo Picos, C.A. Dimitriadis, "Using
the Light-impact Model for p-type and n-type poly-TFT in circuits", IEEE
18th Int. Conf. on Mixed Design of Integrated Circuits and Systems, (MIXDES
2011), pp. 113-118, Gliwice, Poland 16-18 June 2011
[3.87] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, "Prospects of 3D Inductors on
Through Silicon Vias Processes for 3D ICs," 19th IFIP/IEEE International
Conference on Very Large Scale Integration, (VLSI-SoC 2011), pp. 90-93, Hong
Kong, China, October 3–5, 2011.
[3.88] Y.
Bontzios, M. Dimopoulos, N. Tsatsoulis, A. Hatzopoulos, "Closed-Form
Expressions for the Coupling Capacitance of Metal Fill Tiles in VLSI
Circuits," XXVI Conference on Design of Circuits and Integrated Systems,
(DCIS 2011), pp. 471-474, Albufeira, Portugal, 16-18 November 2011.
[3.89] Pappas, I., Siskos, S., Hatzopoulos, A.A. “A new analog
output buffer for data driver of active matrix displays using low-temperature
polycrystalline silicon thin-film transistors”, Proc. of the IEEE
15th Int. Symposium on Design and Diagnostics of Electronic Circuits and
Systems, DDECS 2012
[3.90] I.
Pappas, S. Siskos, A.A. Hatzopoulos, “Design of an Analog Output Buffer for
Active Matrix Displays Using Low-Temperature Polycrystalline Silicon Thin-Film
Transistors”, Proc. 19th International Conf. Mixed Design of Integrated
Circuits and Systems, MIXDES 2012, Warsaw, Poland, May 2012.
[3.91] Y.
Bontzios, M. Dimopoulos, A. Hatzopoulos, "Extending the Closed-form
Expressions For Substrate Resistance and
Capacitance Extraction for practical non-ideal shapes," XXVII Conference
on Design of Circuits and Integrated Systems, (DCIS 2012), Avignon, France, 27-30
November 2012.